Methods of fabricating integrated circuits for high voltages
Abstract
Bipolar integrated circuits with breakdown voltages from 200 to 250 V were produced using three techniques. Aluminum implantation with subsequent diffusion was employed as a fast insulation method. Heavily phosphorous-doped V grooves allowing a low-ohmic collector contact were studied. Polycrystalline silicon doped with oxygen, used as a passivation layer shows excellent results in suppressing parasitic MOS-channels.
- Publication:
-
Final Report Valvo G.m.b.H
- Pub Date:
- December 1980
- Bibcode:
- 1980vgmb.rept.....W
- Keywords:
-
- Electrical Faults;
- Electrical Insulation;
- Fabrication;
- High Voltages;
- Integrated Circuits;
- Aluminum;
- Doped Crystals;
- Low Resistance;
- Oxygen;
- Passivity;
- Phosphorus;
- Electronics and Electrical Engineering