Determining the mode of high voltage breakdowns in vacuum devices
Abstract
Techniques for examining high voltage breakdowns (HVBs) in vacuum devices are discussed. Photography in conjunction with other diagnostic techniques is used to establish the validity of these techniques. The techniques examined are to measure the voltage applied to the device (or the current through the device) and also to look for X-rays generated by the device during an HVB.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- July 1980
- Bibcode:
- 1980STIN...8111328M
- Keywords:
-
- Electrical Faults;
- Electronic Equipment;
- High Voltages;
- Vacuum Systems;
- Anodes;
- Diodes;
- Electrodes;
- Failure Analysis;
- Flashover;
- Insulators;
- Photography;
- X Ray Analysis;
- Electronics and Electrical Engineering