The short-term stability of the characteristics of ferroelectric microwave capacitors
Abstract
Experimental results are presented on the short-term stability of the volt-farad and volt-ampere characteristics of ferroelectric capacitors at a temperature of 20 C as a function of pump voltage at 1 GHz. Planar capacitors based on Ba(0.4)Sr(0.6)TiO3 films were studied; the film thickness was 2-4 microns and the gap width was 15 microns + or - 1 micron. It is shown that the short-term stability of the capacitor characteristics was determined by the time-dependence of capacitance variations associated with the polarization properties of the capacitor.
- Publication:
-
Radiotekhnika i Elektronika
- Pub Date:
- September 1980
- Bibcode:
- 1980RaEl...25.2020D
- Keywords:
-
- Capacitors;
- Component Reliability;
- Ferroelectricity;
- Metal Films;
- Microwave Equipment;
- Volt-Ampere Characteristics;
- Barium Oxides;
- Film Thickness;
- Polarization (Charge Separation);
- Strontium Compounds;
- Temperature Dependence;
- Time Dependence;
- Titanium Oxides;
- Electronics and Electrical Engineering