Application of multiobjective 'camera obscura' system for measuring electron temperature of plasma generated in the plasma focus device
Abstract
The method considered for measuring plasma electron temperature is based on a comparison of the intensity of plasma X-rays which pass through two parallel filters, that are made of the same material, but differ in thickness. The intensity of the transmitted X-rays is a function of the plasma electron temperature. The intensity of the transmitted radiation may be measured by means of scintillating probes, semiconductor detectors, or X-ray films. Attention is given to the method of measurement, the calculation of X-ray transmission through filters, and aspects of measurements and film calibration.
- Publication:
-
Journal of Technical Physics
- Pub Date:
- 1980
- Bibcode:
- 1980JTePh..21..375D
- Keywords:
-
- Electron Energy;
- Optical Filters;
- Plasma Diagnostics;
- Plasma Focus;
- Plasma Temperature;
- Cameras;
- Electronic Filters;
- Spatial Distribution;
- Temperature Distribution;
- Temperature Measurement;
- X Ray Analysis;
- Plasma Physics