Testing of decomposable circuits
Abstract
The application of decomposition for the designing of easily tested combinational switching circuits indicates that nonredundant circuits can always be produced using this method. The concept of union redundancy is examined and sufficient conditions for redundancy-free circuits resulting from the decomposition are formulated; easily tested subcircuits can be designed if these conditions are fufilled. Also, a simple technique of testing circuit damage is presented; conditions which insure that all subcircuit faults are detected are given.
- Publication:
-
Archiwum Automatyki i Telemechaniki
- Pub Date:
- 1980
- Bibcode:
- 1980ArAuT..25..211W
- Keywords:
-
- Component Reliability;
- Electronic Equipment Tests;
- Redundant Components;
- Switching Circuits;
- Circuit Diagrams;
- Matrices (Mathematics);
- System Failures;
- Electronics and Electrical Engineering