Diode step stress program for JANTX1N5415
Abstract
Diode JANTX1N5415 was tested to evaluate the reliability of these devices from different manufacturers, and to gain more knowledge of stress testing. The tests for determining power/temperature step stresses are described, and the test results are discussed. Failure analyses for power stress, and temperature stress are presented.
- Publication:
-
Final Report DCA Reliability Lab
- Pub Date:
- January 1979
- Bibcode:
- 1979dcar.reptQV....
- Keywords:
-
- Diodes;
- Field Effect Transistors;
- Performance Tests;
- Electric Potential;
- Failure Analysis;
- Reliability Engineering;
- Thermal Stresses;
- Transistors;
- Electronics and Electrical Engineering