Diode step stress program for JANTX1N5552
Abstract
The effect of power/temperature step stress when applied to the switching diode JANTX1N5554 manufactured by Semtech and Micro Semiconductor was evaluated. A total of 48 samples from each manufacturer were submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing.
- Publication:
-
Final Report DCA Reliability Lab
- Pub Date:
- January 1979
- Bibcode:
- 1979dcar.reptQT....
- Keywords:
-
- Diodes;
- Electrical Resistance;
- Stress Analysis;
- Switching Circuits;
- Temperature Effects;
- Thermal Stresses;
- Acceptability;
- Electronic Equipment Tests;
- Performance Tests;
- Reliability Analysis;
- Electronics and Electrical Engineering