A low energy electron magnetometer

The concept of a highly sensitive magnetometer based on the deflection of low energy electron beams in magnetic fields is analyzed. Because of its extremely low mass and consequently high e/m ratio, a low energy electron is easily deflected in a magnetic field, thus providing a basis for very low field measurement. Calculations for a specific instrument design indicate that a low energy electron magnetometer (LEEM) can measure magnetic fields as low as 1000 nT. The anticipated performance of LEEM is compared with that of the existing high resolution magnetometers in selected applications. The fast response time of LEEM makes it especially attractive as a potential instrument for magnetic signature analysis in large engineering systems.