Long-term dormant storage of microelectronic components
Abstract
An analysis is presented of the long-term dormant storage test data experimentally accumulated on two microelectronic devices. All relevant information on the experimental test program was reviewed very carefully. The existence of error sources, anomalous data, and data acquisition discontinuities was identified. The unanticipated final result of the analysis was that the data collected was of an insufficient quality to enable the identification of any aging behavior as a function of time, temperature, or operational stress.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- July 1979
- Bibcode:
- 1979STIN...7933408D
- Keywords:
-
- Circuit Reliability;
- Component Reliability;
- Microelectronics;
- Storage Stability;
- Aging (Materials);
- Long Term Effects;
- Semiconductors (Materials);
- Electronics and Electrical Engineering