Fault analysis of analog circuits
Abstract
The case is considered in which the measurement of all node voltages is possible under certain test conditions. In addition, the simulation of the adjoint circuit on the computer is required. The approach can detect large parameter variations, is highly computationally efficient, and it does not require massive storage. The formulation permits identification of necessary and sufficient test measurement errors on the approach is investigated. The approach is adapted for fault detection in circuits with accessibility to only part of the nodes. Major application is the single fault identification. It is shown that input and output voltage measurements are enough to identify single faults. The extension of the approach to the fault analysis of analog circuits with some nonlinear elements is discussed. It is shown that any number of operating points on the 1-5 characteristic of the faulty nonlinear elements can be determined.
- Publication:
-
Ph.D. Thesis
- Pub Date:
- 1979
- Bibcode:
- 1979PhDT.......130S
- Keywords:
-
- Analog Circuits;
- Circuit Reliability;
- Component Reliability;
- Electrical Faults;
- Linear Circuits;
- Nonlinearity;
- Volt-Ampere Characteristics;
- Electronics and Electrical Engineering