Controllability/observability analysis of digital circuits
Abstract
The testability of a digital circuit is directly related to the difficulty of controlling and observing the logical values of internal nodes from circuit inputs and outputs, respectively. A method for analyzing digital circuits in terms of six functions which characterize combinational and sequential controllability and observability is presented.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- November 1978
- Bibcode:
- 1978STIN...8011352G
- Keywords:
-
- Circuit Reliability;
- Digital Integrators;
- Digital Systems;
- Integrated Circuits;
- Large Scale Integration;
- Electrical Engineering;
- Gates (Circuits);
- Logic Design;
- Vector Analysis;
- Electronics and Electrical Engineering