Some parameters affecting the minimum diffracting volume of the back reflection line Kossel patterns
Abstract
Back-reflection Kossel line patterns of selected diffraction areas were obtained by use of a simple attachment fitted to a scanning electron microscope, and parameters affecting the contrast in the back-reflection Kossel line patterns are studied. The parameters considered are the accelerating voltage, X-ray filter, and grain perfection. A partially recrystallized low-carbon steel sheet was investigated, and it is concluded that dynamic diffraction patterns from selected areas as small as 1.5 micrometers can be obtained and that there is a correspondence between the grain perfection observed metallographically and the sharpness and continuity of the diffracted lines. The problem of extraneous lines is considered, and the advantages of back-reflection Kossel line patterns in comparison with pseudo-Kossel line patterns are indicated.
- Publication:
-
Revista Brasileira de Fisica
- Pub Date:
- April 1978
- Bibcode:
- 1978RBrFi...8...35T
- Keywords:
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- Imaging Techniques;
- Kossel Pattern;
- Metallography;
- Recrystallization;
- X Ray Diffraction;
- Carbon Steels;
- Diffraction Patterns;
- Electron Microscopes;
- Numerical Integration;
- Instrumentation and Photography