US Army Panama field test of plastic encapsulated devices
Abstract
Over 175 million device hours have been accumulated on 5688 transistors and 1316 bipolar microcircuits in seven year of testing in the Panama Canal Zone. Failure rates and failure modes of biased and stored plastic encapsulated devices are detailed. The data indicate that certain plastic packaged microcircuits have performed as well as hermetic ceramic units on this test. Preliminary CMOS reliability information is also presented.
- Publication:
-
Microelectronics Reliability
- Pub Date:
- 1978
- Bibcode:
- 1978MiRe...17..387H
- Keywords:
-
- Bipolar Transistors;
- Circuit Reliability;
- Electronic Equipment Tests;
- Encapsulating;
- Failure Modes;
- Integrated Circuits;
- Ceramics;
- Cmos;
- Electronic Packaging;
- Hermetic Seals;
- Microelectronics;
- Panama Canal Zone;
- Plastics;
- Transistor Circuits;
- Electronics and Electrical Engineering