Free-space permittivity measurements on dielectric materials at millimeter wavelengths
Abstract
A system is described for measuring the complex permittivities of rigid dielectric sheet materials at millimeter wavelengths, using free-space transmission techniques and Brewster angle determinations. A first-order analysis is given for the effect of multiple reflections in thick low-loss dielectric sheets, under conditions of oblique incidence. Values of relative permittivity and the loss tangent are given for selected sheet materials at 35 GHz and 25 C, that are estimated to be accurate to plus or minus 5%.
- Publication:
-
IEEE Transactions on Instrumentation Measurement
- Pub Date:
- March 1978
- DOI:
- 10.1109/TIM.1978.4314617
- Bibcode:
- 1978ITIM...27...54C
- Keywords:
-
- Dielectrics;
- Frequency Stability;
- Millimeter Waves;
- Permittivity;
- Signal Measurement;
- Brewster Angle;
- Complex Variables;
- Electrical Measurement;
- Energy Dissipation;
- Positioning Devices (Machinery);
- Refracted Waves;
- Wave Reflection;
- Electronics and Electrical Engineering