Measurement of the effect of write-erase cycling on noise in MNOS memory transistors
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- August 1978
- DOI:
- 10.1109/T-ED.1978.19221
- Bibcode:
- 1978ITED...25.1042G
- Keywords:
-
- Computer Storage Devices;
- Metal-Nitride-Oxide-Silicon;
- Noise Measurement;
- Transistor Circuits;
- Carrier Mobility;
- Noise Spectra;
- Solid-Solid Interfaces;
- Thin Films;
- Thresholds;
- Volt-Ampere Characteristics;
- Electronics and Electrical Engineering