A new method of detecting defects in electronic devices
Abstract
A functional test is described for detecting concealed defects in electronic devices by measuring the phase noise. The measuring equipment is described, and the applications of this method are demonstrated.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- December 1977
- Bibcode:
- 1977STIN...7829340R
- Keywords:
-
- Electronic Equipment;
- Vibration;
- Circuits;
- Failure Modes;
- Reliability Engineering;
- Semiconductor Devices;
- Electronics and Electrical Engineering