Electrical properties of DuPont Birox and Cermalloy thick film resistors II: Conduction mechanisms
Abstract
An experimental study of the electrical conduction mechanisms in thick film resistors is presented. The resistors were made from one custom and three commercially formulated inks with resistivity compositions ranging from 100 to 1,000,000 OMEGA/square in decade increments. Their microstructure and composition have been examined using optical and scanning electron microscopy, electron microprobe analysis, X ray diffraction, and various chemical analyses. This portion of the study shows that the resistors are heterogeneous mixtures of metal oxide particles and a lead silicate glass. The metal oxide particles are ruthenium containing pyrochlores, and are joined to form a continuous three dimensional network of chain segments. The principal experimental work reported is an extensive study of the electrical transport properties of the resistors.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- May 1977
- Bibcode:
- 1977STIN...7819428P
- Keywords:
-
- Electric Conductors;
- Electrical Properties;
- Resistors;
- Thick Films;
- Electrical Resistivity;
- Electron Microscopy;
- Metal Oxides;
- X Ray Diffraction;
- Electronics and Electrical Engineering