Measurements of the close-to-carrier F.M. noise of pulsed InP T.E.O.s primed by an external oscillator
Abstract
Experiments on phase-primed, pulsed InP transferred-electron oscillators show that the noise due to priming jitter can be reduced below the inherent noise level of the oscillator. Measurements are presented on the magnitude and spectrum of the oscillator noise.
- Publication:
-
Electronics Letters
- Pub Date:
- June 1977
- DOI:
- 10.1049/el:19770252
- Bibcode:
- 1977ElL....13..344P
- Keywords:
-
- Frequency Modulation;
- Indium Phosphides;
- Noise Measurement;
- Noise Spectra;
- Pulse Generators;
- Electron Oscillations;
- Frequency Response;
- Spectrum Analysis;
- Very Low Frequencies;
- Electronics and Electrical Engineering