Plane dielectric waveguides: Test methods and applications
Abstract
Experimental and theoretical investigations were carried out concerning the problem of accuracy and behavior of the computer algorithm associated with the evaluation of refractive index and thickness of light-guiding multimode films. New methods for dispersion and thickness measurement of thin monomode and very thin non-light-guiding films were developed. Fundamental problems, such as sensitivity and reproducibility of thin film spectroscopy with light-guiding film, are also dealt with.
- Publication:
-
Final Report Zeiss (Carl
- Pub Date:
- June 1976
- Bibcode:
- 1976zcog.rept.....T
- Keywords:
-
- Dielectrics;
- Optical Waveguides;
- Planar Structures;
- Accuracy;
- Algorithms;
- Coupled Modes;
- Film Thickness;
- Optical Thickness;
- Photometers;
- Refractivity;
- Spectroscopy;
- Thin Films;
- Wave Dispersion;
- Optics