Hybrid microcircuit reliability data /2nd edition/

This volume contains hybrid-device test and operational data which may be useful in parts selection, failure-rate predictions, screening decisions, preparation of environmental test specifications, analysis of failure modes and effects, and corrective-action decisions. Qualifying codes and descriptors are included to allow selection of specific data subsets for specialized analyses. The data presented and analyzed include experienced vs predicted failure rates, fallout results for hybrid devices subjected to screening sequences, and failure classifications. The constituents of the detailed device descriptors are indexed, and detailed test data are tabulated according to manufacturer and device type.