Manufacturing methods and technology program for beam lead sealed junction semiconductor devices
Abstract
Because of the number of integrated circuits processed to date, along with the favorable probe yield results, the 5400 and 54LS processes have been well established. Results on the discrete devices, however, have not been as promising. Additional lots of each device type are being processed in an attempt at further improving yields. Packages for all of the devices have been designed for use in satisfying the qualification test requirements.
- Publication:
-
Quarterly Progress Report
- Pub Date:
- November 1976
- Bibcode:
- 1976moto.reptT....B
- Keywords:
-
- Beam Leads;
- Production Management;
- Semiconductor Devices;
- Technology Assessment;
- Electric Connectors;
- Integrated Circuits;
- Technology Utilization;
- Threshold Gates;
- Electronics and Electrical Engineering