Computer controlled data measurement and analysis system used for measuring switching parameters of semiconductors
Abstract
A computer-controlled data acquisition system which was employed to measure the threshold switching parameters of amorphous semiconductors is described. This system is capable of measuring the delay time required for a sample to switch, the electrical energy put into a sample and the charge passing through it during the delay time, and its ambient temperature. With this equipment an experimenter is able to control the magnitude and maximum duration of the voltage applied to a sample, the time interval between applications of voltage, and the load resistor in series with a sample. An HP 2114B minicomputer provides control and analysis capabilities for this system. Basically, this apparatus is a constant voltage pulse generator and signal processor. Major modules of this system are a transistorized high voltage switch, a digitally controlled high voltage resistor and power supply, a low-thermal-noise input-scanner, a precision timer, and two analog integrators.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- January 1976
- Bibcode:
- 1976STIN...7710437C
- Keywords:
-
- Amorphous Semiconductors;
- Data Acquisition;
- Data Reduction;
- Numerical Control;
- Electric Potential;
- Electrical Resistivity;
- Minicomputers;
- Pulse Generators;
- Signal Processing;
- Switching;
- Electronics and Electrical Engineering