A method for experimental investigation of diffraction structures by means of an elliptically polarized field

A procedure for investigating diffraction structures empirically by utilizing an elliptically polarized field is proposed, making use of a variety of measurements while minimizing measuring time and offering sufficiently high accuracy. The fundamental wave (wave number below unity) traversing the periodic structure receives an additional phase jump, and measurements of the characteristics of the ellipse for the incident and transmitted waves completely determine the parameters of the field scattered by the structure under test. The probe field must be narrowly beamed, with low sidelobe levels, and transformation from circular to linear polarization must be possible. Electronic and mechanical details of the test arrangement are indicated.