An image data collection system for electron microscopy
Abstract
As part of the development of an ultrahigh vacuum cryogenic high resolution electron microscope, a computer interfaced in line image data collection system was designed, built and bench tested. This system is made up of a lens coupled single stage intensified vidicon camera interfaced by slow scanning to a small computer. As background to the testing, the relationship between detective quantum efficiency, conversion gain and data collection system noise is explained by use of a simplified model of a generalized EM image data collection system. The bench tests demonstrated the successful functioning of the system as an image data collection and transfer device. By means of a point-by-point decalibration technique the fixed pattern noise of the camera is reduced by more than a factor of 6 to an almost negligible level. The tests also revealed that the system overall conversion gain was not adequate to achieve the goal of a high defective quantum efficiency for image electrons.
- Publication:
-
Ph.D. Thesis
- Pub Date:
- 1976
- Bibcode:
- 1976PhDT........63G
- Keywords:
-
- Electron Microscopes;
- Imaging Techniques;
- Computer Techniques;
- Data Acquisition;
- Image Resolution;
- Inelastic Collisions;
- Vidicons;
- Instrumentation and Photography