Von Hippel's method of permittivity measurement with time domain reflectometry
Abstract
Time domain reflectometry is used to measure the complex permittivity of a dielectric sample filling a section of a coaxial line and placed in front of a short circuit. Equipments necessary to make the measurements, data handling system and data analysis are examined. These examinations include an outline of some difficulties which have been recognized especially in the case of low dielectric permittivity and low losses and how these difficulties have been overcome. Errors in the real and imaginary parts of the complex permittivity are about 2 percent and 10 percent, respectively.
- Publication:
-
L'Onde Electrique
- Pub Date:
- April 1976
- Bibcode:
- 1976LOEle..56..204R
- Keywords:
-
- Coaxial Cables;
- Dielectrics;
- Impedance Measurement;
- Permittivity;
- Reflectometers;
- Complex Variables;
- Data Systems;
- Fourier Transformation;
- High Frequencies;
- Short Circuits;
- Transcendental Functions;
- Instrumentation and Photography