Dispersive reflection spectroscopy in the far infrared using a polarising interferometer
Abstract
A polarising interferometer designed for dispersive reflection measurements on solids between about 5 and 210 cm -1 at temperatures between 77°K and 300°K is described and its performance illustrated with measurements of the complex reflectivity spectra of CsI, KDP and ADP at 300°K. in the range 40-210 cm -1. The dielectric functions resulting from these spectra are given and are in good agreement with published data. In addition, the self energy and damping functions are computed for CsI. Developments for future measurements down to 77°K and 5cm -1 are discussed.
- Publication:
-
Infrared Physics
- Pub Date:
- August 1976
- DOI:
- 10.1016/0020-0891(76)90071-3
- Bibcode:
- 1976InfPh..16..515L
- Keywords:
-
- Adenosine Diphosphate;
- Cesium Iodides;
- Far Infrared Radiation;
- Interferometers;
- Molecular Spectroscopy;
- Potassium Phosphates;
- Antiferroelectricity;
- Crystal Optics;
- Ferroelectricity;
- Spectral Reflectance;
- Instrumentation and Photography