Effects of EMP induced transients on integrated circuits
Abstract
Fourteen types of integrated circuits were tested to determine their short electromagnetic pulse (EMP) failure thresholds. Pulses used during the test ranged from 25 nanoseconds to 20 microseconds with emphasis on the range below 1 microsecond. The purpose of the tests was to establish the minimum failure thresholds for a group of circuits which interface with the interconnecting cables for a family of equipment, in order to establish system level interface protection requirements for the overall system. This protection could take the form of an overall protective shelter, cable shielding, or surge protection of individual interfaces.
- Publication:
-
International Symposium on Electromagnetic Compatibility
- Pub Date:
- 1975
- Bibcode:
- 1975emc..symp.....V
- Keywords:
-
- Circuit Protection;
- Circuit Reliability;
- Electromagnetic Pulses;
- Electronic Equipment Tests;
- Integrated Circuits;
- Transient Response;
- Metal Oxide Semiconductors;
- System Failures;
- Test Equipment;
- Thresholds;
- Electronics and Electrical Engineering