Accurate measurements of noise parameters in ultra-low noise opto-feedback spectrometer systems
Abstract
The accurate measurement of the basic electronic noise parameters of ultra-low noise spectrometer systems was developed in the frequency domain by spectrum analysis. This method overcomes some of the difficulties experienced in using conventional techniques. An analytic and experimental comparison between time and frequency domain techniques was carried out and the use of the latter as a method to develop extremely low-noise detector and preamplifier packages is demonstrated. The origin of the remaining noise in high quality systems was traced to surface and gate junction generation through traps in the preamplifier.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- May 1975
- Bibcode:
- 1975STIN...7618417.
- Keywords:
-
- Noise Measurement;
- Preamplifiers;
- Spectrometers;
- Feedback;
- Frequency Analyzers;
- Gates (Circuits);
- Power Spectra;
- Transfer Functions;
- Instrumentation and Photography