Autoprobe testing for emitter-collector spikes in microwave bipolar transistors
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- November 1975
- DOI:
- Bibcode:
- 1975ITED...22.1052T
- Keywords:
-
- Automatic Test Equipment;
- Bipolar Transistors;
- Integrated Circuits;
- Microwave Circuits;
- Volt-Ampere Characteristics;
- Direct Current;
- Electronic Equipment Tests;
- Emitters;
- Spikes;
- Wafers;
- Electronics and Electrical Engineering