Capacitor bonding techniques and reliability
Abstract
The effect of thermal cycling on the mechanical failure of bonded ceramic chip capacitors mounted on alumina substrates is studied. It is shown that differential thermal expansion is responsible for the cumulative effects which lead to delayed failure of the capacitors. Harder or higher melting solders are found to be less susceptible to thermal cycling effects, although they are more likely to fail during initial processing operations.
- Publication:
-
Inventing the Model of the Future
- Pub Date:
- 1974
- Bibcode:
- 1974imf..proc..379K
- Keywords:
-
- Capacitors;
- Ceramics;
- Circuit Reliability;
- Soldered Joints;
- Thermal Cycling Tests;
- Aluminum Oxides;
- Chips;
- Failure Modes;
- Hybrid Circuits;
- Microelectronics;
- Modulus Of Elasticity;
- Soldering;
- Strain Gages;
- Thermal Expansion;
- Weld Strength;
- Electronics and Electrical Engineering