Irradiation test procedure and reliability aspects of electronic devices for the Symphonie satellite
Abstract
Qualification lots of electronic components, including resistors, capacitors, connectors and thermistors, diodes, bipolar and unipolar transistors, and logic and opto-electronic devices were subjected to two-step electron irradiation of at least 1 MeV under test conditions identical with the COMSAT-spectrum for an equatorial synchron orbit. All components except high voltage diodes and thermistors were shielded. Dosimetry, irradiation simulation, and test procedures are described, and results are tabulated. It was found that passive components, diodes, junction FETs, and TTL ICs suffered no damage; transistors were very sensitive to ionization; the tested optocoupler was unsuitable; and one out of ten high voltage diodes experienced catastrophic damage. Evaluation of shielding for optocouplers and the maverick selection of high voltage diodes are described.
- Publication:
-
Evaluation of the effect of the space environment on materials; International Conference
- Pub Date:
- 1974
- Bibcode:
- 1974eese.conf..765S
- Keywords:
-
- Astrionics;
- Circuit Reliability;
- Component Reliability;
- Electron Irradiation;
- Electronic Equipment Tests;
- Symphonie Satellites;
- Bipolar Transistors;
- Dosimeters;
- Field Effect Transistors;
- Junction Diodes;
- Junction Transistors;
- Quality Control;
- Space Environment Simulation;
- Thermistors;
- Ttl Integrated Circuits;
- Volt-Ampere Characteristics;
- Electronics and Electrical Engineering