The effect of mixed radiation fields on electronic devices
Abstract
The successful operation of high-energy particle accelerators and storage rings depends upon the reliability of electronic devices. Primary high-energy protons, which are lost during machine operation, produce secondary particle fluxes of protons, neutrons, pions, gammas, etc., sufficiently high to seriously affect the performance of electronic devices. In order to avoid drastic failure during machine operation due to radiation damage of electronic components, simulation tests have been carried out in different radiation sources, for example, nuclear reactors, near the existing CERN accelerators and in gamma irradiators. The performance of individual components, such as diodes, capacitors, transistors and integrated circuits was studied under different sources and conditions. The results of these investigations are given as well as a comparison of damage effects in different radiation environments.
- Publication:
-
Evaluation of the effect of the space environment on materials; International Conference
- Pub Date:
- 1974
- Bibcode:
- 1974eese.conf..755S
- Keywords:
-
- Circuit Reliability;
- Electronic Equipment;
- Particle Accelerators;
- Particle Flux Density;
- Radiation Damage;
- Radiation Effects;
- Europe;
- Gamma Rays;
- Neutrons;
- Nuclear Reactors;
- Nuclear Research;
- Pions;
- Protons;
- Electronics and Electrical Engineering