Microcircuit generic environmental data
Abstract
The compendium contains environmental test and screen/burn-in results on microcircuit devices. Data are organized according to applied test stress and device generic properties. Aside from a description of the device and stress conditions, each entry reports the number of devices tested, number failed and observed failure modes. A total of 1563 data entries are contained in this monolithic environmental data and screen/burn-in results. This compendium is revised and reissued annually.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- October 1974
- Bibcode:
- 1974STIN...7527278.
- Keywords:
-
- Environmental Tests;
- Failure Modes;
- Microelectronics;
- Circuit Reliability;
- Performance Tests;
- Reliability Analysis;
- Tables (Data);
- Electronics and Electrical Engineering