Dielectric strength of X-cut quartz after thermally induced stress cycling: Application to understanding the Sandia Quartz gauge
Abstract
The possible origins of the so-called -X anomaly in the Sandia Quartz gage are discussed. Recently, experiments were performed to determine the dielectric strength of SiO2 under conditions simulating some aspects of gage operation. These data as well as the work of Korzo suggest that quartz that has been severely thermally or mechanically strained may break down at electric fields considerably below those characterizing unstrained single crystal quartz. It is concluded that these facts enhance the possibility that the -X anomaly is a breakdown phenomenon depsite the low fields characterizing its occurrence.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- August 1974
- Bibcode:
- 1974STIN...7517640S
- Keywords:
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- Dielectric Properties;
- Quartz Crystals;
- Stress Cycles;
- Thermal Stresses;
- Electric Fields;
- Measuring Instruments;
- Silicon Dioxide;
- Instrumentation and Photography