Automatic load contour mapping for microwave power transistors
Abstract
A technique for large signal characterization of microwave power transistors is described. A computer-controlled apparatus is used to map contours of constant power and efficiency on a Smith chart for dynamic matching of both input and output circuits.
- Publication:
-
IEEE Transactions on Microwave Theory Techniques
- Pub Date:
- December 1974
- DOI:
- 10.1109/TMTT.1974.1128456
- Bibcode:
- 1974ITMTT..22.1146C
- Keywords:
-
- Microwave Amplifiers;
- Numerical Control;
- Power Amplifiers;
- Smith Chart;
- Transistor Amplifiers;
- Amplifier Design;
- Automatic Test Equipment;
- Computer Techniques;
- Impedance Measurement;
- Mapping;
- Network Analysis;
- Servocontrol;
- Signal Analysis;
- Standing Wave Ratios;
- Tuning;
- Volt-Ampere Characteristics;
- Electronics and Electrical Engineering