Effects of stress on the electrical resistance of ytterbium and calibration of ytterbium stress transducers
Abstract
The effect of dynamic compressive stress on the electrical resistance of 0.005 cm (2 mil) thick ytterbium foil was studied over the range 0 to 33.40 kbar. This material has been used successfully as the active element in dynamic stress transducers with major application to in situ geological measurements and laboratory measurements in inhomogeneous materials.
- Publication:
-
Stanford Univ. Report
- Pub Date:
- August 1973
- Bibcode:
- 1973stan.rept.....G
- Keywords:
-
- Electrical Resistance;
- Electronic Transducers;
- Stress Analysis;
- Ytterbium;
- Dynamic Stability;
- Foils (Materials);
- Geology;
- Soil Mechanics;
- Electronics and Electrical Engineering