Dielectric Constant of PbTe
Abstract
The low frequency dielectric constant of PbTe was determined by measuring the barrier capacitances of PbTe abrupt junctions at about 100 kc/s and low temperatures. The junctions were made by alloying In to p-type base crystals or Ag-Te alloy to n-type crystals. The donor or acceptor density in crystals was controlled by heat treatment to range from 1.5×1017 to 8.0×1018 cm-3. As the low frequency dielectric constant of PbTe a value of 400 was obtained, which is approximately constant in the temperature range from 4.2 to 130°K and in the frequency range from 10 to 150 kc/s. This high value of dielectric constant is sufficient to explain the large value of carrier mobility in PbTe at low temperatures.
- Publication:
-
Japanese Journal of Applied Physics
- Pub Date:
- January 1963
- DOI:
- 10.1143/JJAP.2.6
- Bibcode:
- 1963JaJAP...2....6K