Investigation of Program Noise in Charge Trap Based 3D NAND Flash Memory Hou, Wei ; Jin, Lei ; Jia, Xinlei ; Wang, Zhiyu ; Wang, Qiguang ; Luo, Zhe ; Li, Da ; Xu, Feng ; Huo, Zongliang Abstract Publication: IEEE Electron Device Letters Pub Date: January 2020 DOI: 10.1109/LED.2019.2954621 Bibcode: 2020IEDL...41...30H