X-ray phase imaging with the unified modulated pattern analysis of near-field speckles at a laboratory source Zdora, M. -C. ; Zanette, I. ; Walker, T. ; Phillips, N. W. ; Smith, R. ; Deyhle, H. ; Ahmed, S. ; Thibault, P. Abstract Publication: Applied Optics Pub Date: March 2020 DOI: 10.1364/AO.384531 Bibcode: 2020ApOpt..59.2270Z