Volumetric Analysis of Micro-Craters in Apollo 16 Samples via X-Ray Computed Tomography and Laser Confocal Microscopy
Abstract
High resolution X-ray computed tomography of Apollo 16 samples reveals the topology and interior deformation of micro-craters at micron-scales.
- Publication:
-
50th Annual Lunar and Planetary Science Conference
- Pub Date:
- March 2019
- Bibcode:
- 2019LPI....50.1708G