Calibration methods of X-ray imaging crystal spectrometer on KSTAR
Abstract
The detailed calibration methods and procedure for the X-ray imaging crystal spectrometer (XICS) in the Korea Superconducting Tokamak Advanced Research device are investigated. A cross comparison from two different diagnostics including the XICS and charge exchange spectrometer is the best option, in particular, when both systems can be operated simultaneously.
- Publication:
-
Review of Scientific Instruments
- Pub Date:
- October 2018
- DOI:
- 10.1063/1.5034023
- Bibcode:
- 2018RScI...89jF108L