Serial Thick Section Gas Cluster Ion Beam Scanning Electron Microscopy Hayworth, Kenneth J. ; Peale, David ; Lu, Zhiyuan ; Xu, C. Shan ; Hess, Harald F. Abstract Publication: Microscopy and Microanalysis Pub Date: August 2018 DOI: 10.1017/S1431927618007705 Bibcode: 2018MiMic..24S1444H