Probe Shaping for Quantitative DPC-STEM Using Segmented Detectors Clark, L. ; Brown, H. G. ; Paganin, D. M. ; Morgan, M. J. ; Matsumoto, T. ; Shibata, N. ; Petersen, T. C. ; Findlay, S. D. Abstract Publication: Microscopy and Microanalysis Pub Date: August 2018 DOI: 10.1017/S143192761800507X Bibcode: 2018MiMic..24S.916C