Automatically emissivity-compensated radiation thermometry
Abstract
This study developed emissivity-compensated radiation thermometry. The principle of this method is based on the combined utilization of effective radiance and a specular reflection parameter. The former value is derived from multiple reflections of radiant flux between a specimen surface with an unknown spectral emissivity and a reflector. The latter value is derived from the reflection pattern of a specimen surface for incident light flux. The measurement system was composed of a radiation thermometer, a cylindrical cavity for multiple reflections, and a laser to obtain the specular reflection parameter. This system enabled the simultaneous measurement of temperature and emissivity of a specimen with any surface irregularities.
- Publication:
-
Journal of Physics Conference Series
- Pub Date:
- August 2018
- DOI:
- 10.1088/1742-6596/1065/12/122008
- Bibcode:
- 2018JPhCS1065l2008T