Robust method to probe the topological charge of a Bessel beam by dynamic angular double slits Zhu, Jing ; Zhang, Pei ; Chen, Dongxu ; Liu, Ruifeng ; Zhou, Yingnan ; Wang, Jinwen ; Gao, Hong ; Li, Fuli Abstract Publication: Applied Optics Pub Date: March 2018 DOI: 10.1364/ao.57.000b39 Bibcode: 2018ApOpt..57B..39Z