Low-temperature phase transformation of CZTS thin films
Abstract
The low temperature phase transformation in the Cu2ZnSnS4 (CZTS) films was investigated by laser annealing and low temperature thermal annealing. The Raman measurements show that a-high-power laser annealing could cause a red shift of the Raman scattering peaks of the kesterite (KS) structure and promotes the formation of the partially disordered kesterite (PD-KS) structure in the CZTS films, and the low-temperature thermal annealing only shifts the Raman scattering peak of KS phase by several wavenumber to low frequency and the broads Raman peaks in the low frequency region. Moreover, the above two processes were reversible. The Raman analyses of the CZTS samples prepared under different process show that the PD-KS structure tends to be found at low temperatures and low sulfur vapor pressures. Our results reveal that the control of the phase structure in CZTS films is feasible by adjusting the preparation process of the films.
Project supported by the Natural Science Foundation for Youth Fund of Hebei Province, China (Grant No. A2016201087), the Specialized Research Fund for the Doctoral Program of Higher Education of China (Grant No. 20131301120003), and the National Natural Science Foundation of China (Grant Nos. 11504078 and 61504054).- Publication:
-
Chinese Physics B
- Pub Date:
- April 2017
- DOI:
- 10.1088/1674-1056/26/4/046402
- Bibcode:
- 2017ChPhB..26d6402Z