Extraction of interface trap density of Al2O3/AlGaN/GaN MIS heterostructure capacitance Osvald, J. ; Stoklas, R. ; Kordoš, P. Abstract Publication: Physica Status Solidi B Basic Research Pub Date: May 2015 DOI: 10.1002/pssb.201451468 Bibcode: 2015PSSBR.252..996O