High-voltage scanning ion microscope: Beam optics and design
Abstract
This article is devoted to the conceptual design of a compact high-voltage scanning ion microscope (HVSIM). In an HVSIM design, the ion optical system is based on a high-brightness ion source. Specifically, the ion optical system is divided into two components: an ion injector and a probe-forming system (PFS) that consists of an accelerating tube and a multiplet of quadrupole lenses. The crossover is formed and controlled by the injector, which acts as an object collimator, and is focused on the image plane by the PFS. The ion microprobe has a size of 0.1 μm and an energy of 2 MeV. When the influence of the chromatic and third-order aberrations is theoretically taken into account, the HVSIM forms an ion microprobe.
- Publication:
-
Nuclear Instruments and Methods in Physics Research B
- Pub Date:
- May 2015
- DOI:
- 10.1016/j.nimb.2015.03.032
- Bibcode:
- 2015NIMPB.350...32M
- Keywords:
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- Probe forming system;
- Microprobe;
- Phase volume