電界放射顕微鏡および走査プローブ顕微鏡による電子源の評価; 電界放射顕微鏡および走査プローブ顕微鏡による電子源の評価; Characterization of an Electron Emitting Tip by Field Emission Microscope and Scanning Probe Microscope
Abstract
- Publication:
-
Journal of the Vacuum Society of Japan
- Pub Date:
- 2015
- DOI:
- 10.3131/jvsj2.58.131
- Bibcode:
- 2015JVSJ...58..131W