Vertical dislocations in Ge films selectively grown in submicron Si windows of patterned substrates Harada, S. ; Kikkawa, J. ; Nakamura, Y. ; Wang, G. ; Caymax, M. ; Sakai, A. Abstract Publication: Thin Solid Films Pub Date: February 2012 DOI: 10.1016/j.tsf.2011.10.092 Bibcode: 2012TSF...520.3245H